Frequency-Comb-Assisted Swept-Wavelength Interferometry
Paper in proceeding, 2021

Swept-wavelength interferometry (SWI) is a highly sensitive and versatile technique implemented in a diverse array of industrial and scientific applications. SWI uses a continuously tunable laser to capture the magnitude and phase response of a device under test (DUT). The prevalent non-linear tuning of the laser calls for an auxiliary interferometer for the calibration of the laser frequency on the fly [1]. However, this approach is susceptible to environmental perturbations, and the inherent dispersion of the interferometer introduces systematic errors. Laser frequency combs can be used as optical rulers against which to calibrate tunable lasers with high- precision and, when self-referenced, with high accuracy [2]. Here, we apply this comb-based calibration approach in the context of SWI for the first time and illustrate its relevance for the characterization of high-Q microresonators.

Author

Krishna Sundar Twayana

Chalmers, Microtechnology and Nanoscience (MC2), Photonics

Zhichao Ye

Chalmers, Microtechnology and Nanoscience (MC2), Photonics

Òskar Bjarki Helgason

Chalmers, Microtechnology and Nanoscience (MC2), Photonics

Magnus Karlsson

Chalmers, Microtechnology and Nanoscience (MC2), Photonics

Victor Torres Company

Chalmers, Microtechnology and Nanoscience (MC2), Photonics

2021 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2021


9781665418768 (ISBN)

2021 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2021
Munich, Germany,

Subject Categories

Medical Laboratory and Measurements Technologies

Atom and Molecular Physics and Optics

Other Physics Topics

DOI

10.1109/CLEO/Europe-EQEC52157.2021.9542001

ISBN

9781557528209

More information

Latest update

12/10/2021