On logic test generation : algorithms and methods for combinational test generation
Licentiate thesis, 2000
bridging faults
switchh level
binary decision diagrams
testability
feedback
ATPG
Author
Hans Kristian Wiklund
Department of Computer Engineering
Subject Categories
Computer Engineering
ISBN
993-257304-3
Technical report L - School of Electrical and Computer Engineering, Chalmers University of Technology. : 346