On V-ce Method: In Situ Temperature Estimation and Aging Detection of High-Current IGBT Modules Used in Magnet Power Supplies for Particle Accelerators
Journal article, 2019
measuring circuits design
Aging detection
insulated gate bipolar transistor (IGBT)
magnet power supplies
V-ce method
temperature monitoring
particle accelerators
Author
Panagiotis Asimakopoulos
European Organization for Nuclear Research (CERN)
Chalmers, Electrical Engineering, Electric Power Engineering, Power grids and Components
Konstantinos Papastergiou
European Organization for Nuclear Research (CERN)
Torbjörn Thiringer
Chalmers, Electrical Engineering, Electric Power Engineering
Massimo Bongiorno
Chalmers, Electrical Engineering, Electric Power Engineering, Power grids and Components
Gilles Le Godec
European Organization for Nuclear Research (CERN)
IEEE Transactions on Industrial Electronics
0278-0046 (ISSN)
Vol. 66 1 551-560Subject Categories
Accelerator Physics and Instrumentation
Other Chemical Engineering
Other Electrical Engineering, Electronic Engineering, Information Engineering
DOI
10.1109/TIE.2018.2823689