Mobility degradation and series resistance in graphene field-effect transistors
Journal article, 2021

Accurate device models and parameter extraction methods are of utmost importance for characterizing graphene field-effect transistors (GFETs) and for predicting their performance in circuit applications. For DC characterization, accurate extraction of mobility and series resistance is of particular concern. In this paper, we show how a first-order mobility degradation model can be used to separate information about mobility degradation and series resistance for a set of GFETs of different channel lengths. Data from a large set of top-gated GFETs based on chemical vapor deposited (CVD) graphene was analyzed to validate the proposed model and extraction procedures. For removing any uncertainties caused by observed device-to-device data variations due to the uneven quality of CVD graphene, the same methods were applied to a set of closely located bottom-gated GFETs found in literature. Those GFETs were designed for transfer length methods and fabricated on exfoliated graphene of homogenous quality. Similar mobility degradation behavior was observed for both sets of devices with the mobility being reduced to half for a voltage-induced charge carrier density of 1013 cm-2.

mobility degradation

series resistance

graphene field-effect transistors

charge carrier mobility

Author

Kjell Jeppson

Chalmers, Microtechnology and Nanoscience (MC2), Terahertz and Millimetre Wave Laboratory

Muhammad Asad

Chalmers, Microtechnology and Nanoscience (MC2), Terahertz and Millimetre Wave Laboratory

Jan Stake

Chalmers, Microtechnology and Nanoscience (MC2), Terahertz and Millimetre Wave Laboratory

IEEE Transactions on Electron Devices

0018-9383 (ISSN)

Vol. 68 6 3091-3095

Graphene Core Project 3 (Graphene Flagship)

European Commission (EC) (881603GrapheneCore3), 2020-04-01 -- 2023-03-31.

Areas of Advance

Information and Communication Technology

Nanoscience and Nanotechnology (SO 2010-2017, EI 2018-)

Infrastructure

Kollberg Laboratory

Nanofabrication Laboratory

Subject Categories

Physical Sciences

Other Physics Topics

Nano Technology

Other Electrical Engineering, Electronic Engineering, Information Engineering

DOI

10.1109/TED.2021.3074479

Related datasets

Mobility degradation and series resistance in graphene field-effect transistors [dataset]

DOI: 10.1109/TED.2021.3074479

More information

Latest update

5/22/2021