Full characterization of a semiconductor laser beam by simultaneous capture of the near- and far-field
Poster (konferens), 2010
We present a new measurement technique for fully characterizing a semiconductor laser beam. The reflections from both surfaces of a planoconvex lens are used to simultaneously capture the near- and far-field. The optical phase is then retrieved using the Gerchberg-Saxton algorithm with improved numerical operations.
Gerchberg-Saxton
phase retrieval
optically pumped semiconductor disk laser (OP-SDL)
vertical-external-cavity surface-emitting laser (VECSEL)
high-power laser
Författare
Carl Borgentun
Chalmers, Mikroteknologi och nanovetenskap, Fotonik
Jörgen Bengtsson
Chalmers, Mikroteknologi och nanovetenskap, Fotonik
Anders Larsson
Chalmers, Mikroteknologi och nanovetenskap, Fotonik
Conference Digest - IEEE International Semiconductor Laser Conference
08999406 (ISSN)
127-128 56427209781424456833 (ISBN)
Styrkeområden
Nanovetenskap och nanoteknik
Ämneskategorier
Telekommunikation
Atom- och molekylfysik och optik
DOI
10.1109/ISLC.2010.5642720
ISBN
9781424456833