Influence of waveguide width errors on TRL and LRL calibrations
Paper i proceeding, 2012
This paper investigates the impact of the waveguide width tolerance in TE10 mode waveguide TRL/LRL calibration kits. This is important for vector network analyzer measurements in the THZ range where waveguide tolerances become large compared the wavelength and to cross sectional dimensions. Besides causing reflections in the waveguide interface, the waveguide width tolerance also causes a change in the propagation constant that can shift the reference planes and cause problems in estimating the propagation constant of the Line standard. We conclude that the tolerances may cause a significant uncertainty contribution and may limit the useful band of the calibration kit.
waveguide
LRL
VNA
S-parameters
TRL
calibration
uncertainty
Författare
Jörgen Stenarson
Gigahertzcentrum
Klas Yhland
Gigahertzcentrum
Thi Ngoc Do Thanh
Gigahertzcentrum
Chalmers, Mikroteknologi och nanovetenskap, Terahertz- och millimetervågsteknik
Huan Zhao Ternehäll
Chalmers, Mikroteknologi och nanovetenskap, Terahertz- och millimetervågsteknik
Gigahertzcentrum
Peter Sobis
Gigahertzcentrum
Jan Stake
Gigahertzcentrum
Chalmers, Mikroteknologi och nanovetenskap, Terahertz- och millimetervågsteknik
79th Automatic RF Techniques Microwave Measurement Conference (ARFTG)
6291182
978-1-4673-1230-1 (ISBN)
Styrkeområden
Informations- och kommunikationsteknik
Ämneskategorier
Reglerteknik
Annan elektroteknik och elektronik
DOI
10.1109/ARFTG79.2012.6291182
ISBN
978-1-4673-1230-1