A Probabilistic Analysis of Resilient Reconfigurable Designs
Paper i proceeding, 2014

Reconfigurable hardware can be employed to tolerate permanent faults. Hardware components comprising a System-on-Chip can be partitioned into a handful of substitutable units interconnected with reconfigurable wires to allow isolation and replacement of faulty parts. This paper offers a probabilistic analysis of reconfigurable designs estimating for different fault densities the average number of fault-free components that can be constructed as well as the probability to guarantee a particular availability of components. Considering the area overheads of reconfigurability, we evaluate the resilience of various reconfigurable designs with different granularities. Based on this analysis, we conduct a comprehensive design-space exploration to identify the granularity mixes that maximize the fault-tolerance of a system. Our findings reveal that mixing fine-grain logic with a coarse-grain sparing approach tolerates up to 3x more permanent faults than component redundancy and 2x more than any other purely coarse-grain solution. Component redundancy is preferable at low fault densities, while coarse-grain and mixedgrain reconfigurability maximize availability at medium and high fault densities, respectively.

Reconfigurable hardware

Fault tolerance

MPSOC

coarse-grain

fine-grain

Författare

Alirad Malek

Chalmers, Data- och informationsteknik, Datorteknik

Stavros Tzilis

Chalmers, Data- och informationsteknik, Datorteknik

Danish Anis Khan

Chalmers, Data- och informationsteknik

Ioannis Sourdis

Chalmers, Data- och informationsteknik, Datorteknik

G. Smaragdos

Erasmus Universiteit Rotterdam

C. Strydis

Erasmus Universiteit Rotterdam

27th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2014, Amsterdam, Netherlands, 1-3 October 2014

1550-5774 (ISSN)

141-146
978-1-4799-6155-9 (ISBN)

Ämneskategorier

Inbäddad systemteknik

Datorsystem

Annan elektroteknik och elektronik

DOI

10.1109/DFT.2014.6962074

ISBN

978-1-4799-6155-9

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2020-12-01