My research is mainly focused on studying and understanding the properties of materials at near atomic spatial resolution. The technique I am using for this purpose is called as Atom Probe Tomography (APT). At present, I am involved in studies of novel multifunctional carbides for hard coatings and electrical contacts. The prime objective of this work is to optimize the parameters of the atom probe analysis and develop the data analysis methods to precisely measure the Carbon concentration in different Carbides, which is always underestimated in an atom probe analysis due to several reasons.
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