Henrik Brenning

Showing 5 publications


Charge noise in single-electron transistors and charge qubits may be caused by metallic grains

Serguei Kafanov, Henrik Brenning, Tim Duty et al
Physical Review B - Condensed Matter and Materials Physics. Vol. 78 (12), p. 125411-
Journal article

A single electron transistor on an atomic force microscope probe

Henrik Brenning, Sergey Kubatkin, D. Erts et al
Nano Letters. Vol. 6 (5), p. 937-941
Journal article

An ultrasensitive radio-frequency single-electron transistor working up to 4.2K

Henrik Brenning, Serguei Kafanov, Tim Duty et al
Journal of Applied Physics. Vol. 100 (11), p. 114321-
Journal article

Probe fabrication for a scanning single-electron-transistor

Henrik Brenning
Licentiate thesis

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