The effect of Bragg reflectors on the electromechanical performance of parallel-plate ferroelectric capacitors
Paper in proceedings, 2010

Parallel-plate capacitors based on ferroelectric thin films are considered as high density capacitors and varactors. Due to the small thickness of the ferroelectric films, typically less than 1.0 mu m, high electric fields are generated even at relatively low voltages inducing piezoelectric effect associated with electrostriction. This induced piezoelectric effect has negative impact on ferroelectric capacitors since it causes extra loss (electroacoustic transformation of microwave energy). In this work the use of Bragg reflectors between the substrate and ferroelectric film is proposed as a possible way of suppression of the enhanced losses associated with the piezoelectric activity of the ferroelectric film.

Author

John Berge

Chalmers, Microtechnology and Nanoscience (MC2), Terahertz and Millimetre Wave Laboratory

Martin Norling

Chalmers, Applied Physics, Physical Electronics

Andrei Vorobiev

Chalmers, Microtechnology and Nanoscience (MC2), Terahertz and Millimetre Wave Laboratory

Spartak Gevorgian

Chalmers, Microtechnology and Nanoscience (MC2), Terahertz and Millimetre Wave Laboratory

IOP Conference Series: Materials Science and Engineering - Fundamentals and Technology of Multifunctional Oxide Thin Films (Symposium G, EMRS 2009 Spring Meeting) 8–12 June 2009, Strasbourg, France

1757-8981 (ISSN)

Vol. 8 1 012011-

Areas of Advance

Information and Communication Technology

Nanoscience and Nanotechnology (2010-2017)

Materials Science

Driving Forces

Sustainable development

Subject Categories

Materials Engineering

Physical Sciences

Roots

Basic sciences

DOI

10.1088/1757-899X/8/1/012011

More information

Created

10/7/2017