The band offset and the critical layer thickness in III-V compound semiconductor heterostructures
Licentiate thesis, 1992

interface morphology

molecular beam epitaxy

band offset

transmission electron microscopy

InGaAs

strain

photoluminescence

critical layer thickness

quantum wells

heterostructures

III-V compounds

Author

Shu Min Wang

Department of Physics

Subject Categories

Physical Sciences

ISBN

991-400113-0

More information

Created

10/7/2017