0.5 Tbit/s eye-diagram measurement by optical sampling using XPM-induced wavelength shifting in highly nonlinear fiber
Paper in proceedings, 2003

Author

Jie Li

Chalmers, Microtechnology and Nanoscience (MC2), Photonics

Mathias Westlund

Chalmers, Microtechnology and Nanoscience (MC2), Photonics

Henrik Sunnerud

Chalmers, Microtechnology and Nanoscience (MC2), Photonics

Bengt-Erik Olsson

Chalmers, Microtechnology and Nanoscience (MC2), Photonics

Magnus Karlsson

Chalmers, Microtechnology and Nanoscience (MC2), Photonics

Peter Andrekson

Chalmers, Microtechnology and Nanoscience (MC2), Photonics

Proc. European Conference on Optical Communication (ECOC'03)

Mo4.6.4-

Subject Categories

Electrical Engineering, Electronic Engineering, Information Engineering

More information

Created

10/7/2017