RF Characterisation of Flip-Chip Aniostropic Conductive Adhesive Joints
Paper in proceeding, 2006
Author
Xu Wang
Shanghai University
Zhaonian Cheng
Shanghai University
Johan Liu
Chalmers, Applied Physics, Electronics Material and Systems
Shanghai University
Proceedings of the eight IEEE CPMT International Symposium on High Density Packaging and Component Failure Anlaysis (HDP´06), Shanghai, China
1-4244-0488-6 (ISBN)
Shanghai, China,
Subject Categories (SSIF 2011)
Other Electrical Engineering, Electronic Engineering, Information Engineering
DOI
10.1109/HDP.2006.1707595