Characterization Accuracy of High-Q Reactors Using Broadband Reflection/Transmission Measurement Techniques
Paper in proceedings, 2006

Characterization accuracy of high-Q reactors due to measurement uncertainties is analyzed in this paper. Two broadband techniques based on reflection and transmission type measurements are considered. A differential calculus combined with an equivalent circuit representation of the measurement error are used here to derive simple analytic formulas. It is shown that the accuracy of calibrated VNA is insufficient to obtain accurate loss data. A measurement procedure is proposed that improves the accuracy of loss measurement. A measurement example is given demonstrating the utility of the above approach.

measurement uncertainties

high-Q reactors

Author

Anatoli Deleniv

Chalmers, Microtechnology and Nanoscience (MC2), Microwave and Terahertz Technology

Spartak Gevorgian

Chalmers, Microtechnology and Nanoscience (MC2), Microwave and Terahertz Technology

Proceedings of EUMC 2006, 10-15 Sept. 2006, Manchester, UK

975-979
2-9600551-6-0 (ISBN)

Subject Categories

NATURAL SCIENCES

ISBN

2-9600551-6-0

More information

Created

10/6/2017