Poster: Trace yourself-it could be easy
Paper in proceeding, 2021
Author
Patrick Rathje
University of Kiel
Olaf Landsiedel
Network and Systems
University of Kiel
International Conference on Embedded Wireless Systems and Networks
25622331 (eISSN)
Vol. 2021 18978-099498865-2 (ISBN)
Delft, Netherlands,
Subject Categories
Reliability and Maintenance
Computer Science
Computer Systems