Comprehensive Armature Reaction Modeling and Flux Weakening Optimization of a Surface Permanent Magnet Vernier Motor
Journal article, 2023

Surface permanent magnet vernier motors (SPMVMs) possess the potential for direct-drive applications due to the feature of high torque density. This paper presents a deep investigation into the armature reaction modeling and a semi-analytical optimization framework considering the constant power speed range (CPSR) in the flux weakening region for the SPMVM. The new armature reaction model can identify the armature air gap flux density of each harmonic component and armature flux linkage accurately, by conducting harmonics analysis, slot leakage flux computation and slotting effect evaluation, permitting to calculate the inductance. Then, the results from the armature reaction model and those obtained from finite element analysis (FEA) at the rated operating point together are applied to a comprehensive semi-analytical motor optimization framework developed for SPMVMs. The optimization framework is able to reflect the motor performance metrics over the entire speed range, with torque density, power factor and CPSR as objectives. Finally, a prototype designed according to the trade-offs of the optimization objectives is fabricated to confirm the validity of the armature reaction model and optimization framework.

Armature

Optimization

Torque

Windings

Air gaps

Synchronous motors

Permanent magnet

optimization

armature reaction model

Harmonic analysis

vernier motor

finite element analysis

Author

Jingwei Zhu

Nanyang Technological University

Ying Fan

Southeast University

Hao Chen

Chalmers, Electrical Engineering, Electric Power Engineering

Jiahao Chen

Nanyang Technological University

Yuefei Zuo

Nanyang Technological University

Christopher H.T. Lee

Nanyang Technological University

IEEE Transactions on Industrial Electronics

0278-0046 (ISSN) 15579948 (eISSN)

Vol. 70 9 8709-8722

Subject Categories

Applied Mechanics

Energy Engineering

Other Electrical Engineering, Electronic Engineering, Information Engineering

DOI

10.1109/TIE.2022.3215844

More information

Latest update

7/7/2023 9