Wave Reflection Effects on Bender Element Test of Very Stiff Clay
Journal article, 2023

A common source of error in bender element testing lies in the determination of the shear wave arrival time arising from the near-field effect, which is attributed to shear wave-like motion of the compression wave obscuring the arrival of the shear waves, and can be mitigated by using a sufficiently high travel-distance-to-wavelength (L/λ) ratio. However, the L/λ ratio also is relevant for signal interference due to side reflections, and its role in this important mechanism is far less understood. Stiff materials such as cement-treated soils, which have a very short shear wave travel time, are likely to exacerbate these errors. This paper examined the causes of travel time errors in cement-treated soil using bender element tests of standard-sized triaxial specimens, large block samples, and three-dimensional finite-element analyses. The results show that the reflection of shear waves from sample boundaries generates a second pulse in the received signal, resulting in signal distortion. This can be ameliorated at sufficiently high L/λ ratios. The reflection of the compressional waves generates spurious prearrivals and distorts the profile of the direct shear wave even at high L/λ ratios. Shear and compressional wave reflections can be mitigated by increasing the specimen diameter to decouple the latter from the direct shear wave arrival.

Cement-treated clay

Small-strain shear modulus

Bender element

Finite-element modeling

Author

Dawn Wong

Chalmers, Architecture and Civil Engineering, Structural Engineering

Yannick Choy Hing Ng

National University of Singapore (NUS)

Jialu Li

National University of Singapore (NUS)

Taeseo Ku

Konkuk University

Siang Huat Goh

National University of Singapore (NUS)

Fook Hou Lee

National University of Singapore (NUS)

Journal of Geotechnical and Geoenvironmental Engineering - ASCE

1090-0241 (ISSN) 19435606 (eISSN)

Vol. 149 9 04023066

Subject Categories

Geotechnical Engineering

DOI

10.1061/JGGEFK.GTENG-11514

More information

Latest update

7/17/2023