In situ characterization of stresses, deformation and fracture of thin films using transmission X-ray nanodiffraction microscopy
Journal article, 2024

The use of hard X-ray transmission nano- and microdiffraction to perform in situ stress and strain measurements during deformation has recently been demonstrated and used to investigate many thin film systems. Here a newly commissioned sample environment based on a commercially available nanoindenter is presented, which is available at the NanoMAX beamline at the MAX IV synchrotron. Using X-ray nanoprobes of around 60-70 nm at 14-16 keV and a scanning step size of 100 nm, we map the strains, stresses, plastic deformation and fracture during nanoindentation of industrial coatings with thicknesses in the range of several micrometres, relatively strong texture and large grains. The successful measurements of such challenging samples illustrate broad applicability. The sample environment is openly accessible for NanoMAX beamline users through the MAX IV sample environment pool, and its capability can be further extended for specific purposes through additional available modules.


sample environment

in situ deformation

stress mapping



Gudrun Lotze

MAX IV Laboratory

Lund Institute of Advanced Neutron and X-ray Science (LINXS)

Anand Harihara Subramonia Iyer

Chalmers, Physics, Microstructure Physics

Olof Bäcke

Chalmers, Physics, Microstructure Physics

Sebastian Kalbfleisch

MAX IV Laboratory

Magnus Hörnqvist Colliander

Chalmers, Physics, Microstructure Physics

Journal of Synchrotron Radiation

0909-0495 (ISSN) 1600-5775 (eISSN)

Vol. 31 Pt 1 42-54

Subject Categories

Accelerator Physics and Instrumentation

Materials Engineering





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