Vertically Aligned Graphene Layers as Thermal Interface Material for Gallium Nitride Semiconductor Components
Paper in proceeding, 2025

Graphene layers have a very high basal plane thermal conductivity, but a low conductivity out-of-plane. When placed on a heat source, they can efficiently spread heat laterally, but not vertically. To fully exploit ultrahigh basal plane thermal conductivity of graphene layers, they can be assembled vertically. We examine the efficiency of vertically aligned graphene layers as thermal interface material (TIM) for gallium nitride (GaN) high electrons mobility transistors (HEMTs) with ceramic packages. The junction temperature (Tj) is directly measured using thermocouples bonded to the die. The measurements are done under free convection in the ambient. The graphene results are compared with two conventional TIMs. It is shown the graphene TIM can lower the Tj by at least 5 °C. More temperature reduction is expected when testing with forced cooling. A transient thermal finite element model is also used for temperature prediction, showing good agreement with the experimental data.

Thermal simulation

Thermal management

High electron mobility transistors

Graphene

Author

Saeed Akbari

RISE Research Institutes of Sweden

Mattias Eng

RISE Research Institutes of Sweden

E. Adolfsson

RISE Research Institutes of Sweden

Konstantin Kostov

RISE Research Institutes of Sweden

Qin Wang

RISE Research Institutes of Sweden

Sepideh Amirpour

Chalmers, Electrical Engineering, Electric Power Engineering

Torbjörn Thiringer

Chalmers, Electrical Engineering, Electric Power Engineering

Jang Kwon Lim

RISE Research Institutes of Sweden

Mietek Bakowski

RISE Research Institutes of Sweden

Dag Andersson

RISE Research Institutes of Sweden

Ashutosh Kumar

RISE Research Institutes of Sweden

Proceedings 2025 26th International Conference on Thermal Mechanical and Multi Physics Simulation and Experiments in Microelectronics and Microsystems Eurosime 2025


9798350393002 (ISBN)

26th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2025
Utrecht, Netherlands,

Subject Categories (SSIF 2025)

Materials Chemistry

Other Electrical Engineering, Electronic Engineering, Information Engineering

DOI

10.1109/EuroSimE65125.2025.11006592

More information

Latest update

6/18/2025