From Logs to Lessons: An Exploration of LLM-based Log Summarization for Debugging Automotive Software
Paper in proceeding, 2026

Identifying where faults occur is an essential part of debugging, yet examining extensive system logs can be slow and mentally demanding, especially in complex software environments. One emerging strategy to enhance log analysis is to employ large language models (LLMs) to distill log information into more manageable summaries that can guide human reasoning during diagnosis. We report on a case study carried out in an automotive setting, where engineers investigated actual failures with and without support from an LLM-based summarization tool. During fault localization sessions where participants analyzed real failure logs, we collected cognitive load measurements, observed their reasoning processes, and gathered feedback on both the LLM-based summarization and the workflow through post-session interviews. Our results indicate that although the use of summaries raised certain cognitive demands, particularly related to mental effort and time pressure, participants experienced less frustration overall and considered the support helpful in focusing their attention. They also expressed a clear interest in being able to shape and refine summaries as their understanding evolved. These findings offer insights into how LLM-generated summaries influence practitioners’ diagnostic work and point toward the need for more adaptive, interactive, and workflow-aware support.

Log Analysis

Automated Software Engineering

Software Logs

Debugging

Large Language Models

Author

Anton Ekström

Student at Chalmers

Hampus Rhedin Stam

Chalmers University of Technology

Francisco Gomes

University of Gothenburg

Chalmers, Computer Science and Engineering (Chalmers), Interaction Design and Software Engineering

Gregory Gay

Chalmers, Computer Science and Engineering (Chalmers), Interaction Design and Software Engineering

University of Gothenburg

Sabina Edenlund

Volvo Cars

AST'26: Proceedings of the 7th ACM/IEEE International Conference on Automation of Software Test

0000-0000 (ISSN)


9798400724763 (ISBN)

7th ACM/IEEE International Conference on Automation of Software Test
Rio de Janeiro, Brazil,

Subject Categories (SSIF 2025)

Software Engineering

Computer Sciences

DOI

10.1145/3793654.3793748

More information

Latest update

8/21/2026