NANOSIL network of excellence - silicon based nanostructures and nanodevices for long-term nanoelectronics applications
Journal article, 2009

NANOSIL Network of Excellence [NANOSIL NoE web site ], funded by the European Commission in the 7th Framework Programme (ICT-FP7, no 216171), aims at European scale integration of the excellent European research laboratories and their capabilities in order to strengthen scientific and technological excellence in the field of nanoelectronic materials and devices for terascale integrated circuits (ICs), and to disseminating the results in a wide scientific and industrial community. NANOSIL is exploring and assessing the science and technological aspects of nanodevices and operational regimes relevant to the n+4 technology node and beyond. It encompasses projects on nanoscale CMOS and beyond-CMOS. Innovative concepts, technologies and device architectures are proposed-with fabrication down to the finest features, and utilising a wide spectrum of advanced deposition and processing capabilities, extensive characterization and very rigorous device modeling. This work is carried out through a network of joint processing, characterization and modeling platforms. This critical interaction strengthens European integration in nanoelectronics and will speed up technological innovation for the nanoelectronics of the next two to three decades.

CMOS

Beyond-CMOS

Carbon electronics

Nanoelectronic structures

Nanodevices

Nanowires

Author

F Balestra

Institut de la Microelectronique, Electromagnetisme et Photonique - Laboratoire d'Hyperfrequences et de Caracterisation

IMEP-FMNT

E Parker

Institut de la Microelectronique, Electromagnetisme et Photonique - Laboratoire d'Hyperfrequences et de Caracterisation

The University of Warwick

D Leadley

The University of Warwick

Institut de la Microelectronique, Electromagnetisme et Photonique - Laboratoire d'Hyperfrequences et de Caracterisation

S Mantl

Institut de la Microelectronique, Electromagnetisme et Photonique - Laboratoire d'Hyperfrequences et de Caracterisation

Forschungszentrum Jülich

E. Dubois

IEMN Institut d'Electronique de Microelectronique et de Nanotechnologie

Institut de la Microelectronique, Electromagnetisme et Photonique - Laboratoire d'Hyperfrequences et de Caracterisation

Olof Engström

Chalmers, Applied Physics, Physical Electronics

R Clerc

Institut de la Microelectronique, Electromagnetisme et Photonique - Laboratoire d'Hyperfrequences et de Caracterisation

IMEP-FMNT

S Cristoloveanu

IMEP-FMNT

Institut de la Microelectronique, Electromagnetisme et Photonique - Laboratoire d'Hyperfrequences et de Caracterisation

M.C. Lemme

Institut de la Microelectronique, Electromagnetisme et Photonique - Laboratoire d'Hyperfrequences et de Caracterisation

RWTH Aachen University

J. P. Raskin

Universite catholique de Louvain

Institut de la Microelectronique, Electromagnetisme et Photonique - Laboratoire d'Hyperfrequences et de Caracterisation

M.C. Lemme

Institut de la Microelectronique, Electromagnetisme et Photonique - Laboratoire d'Hyperfrequences et de Caracterisation

A Ionesco

Swiss Federal Institute of Technology in Lausanne (EPFL)

K. E. Moselund

Swiss Federal Institute of Technology in Lausanne (EPFL)

K Boucart

Swiss Federal Institute of Technology in Lausanne (EPFL)

E Kasper

University of Stuttgart

A Karmous

University of Stuttgart

M Baus

Institut de la Microelectronique, Electromagnetisme et Photonique - Laboratoire d'Hyperfrequences et de Caracterisation

B Spangenberg

RWTH Aachen University

Institut de la Microelectronique, Electromagnetisme et Photonique - Laboratoire d'Hyperfrequences et de Caracterisation

Mikael Östling

Royal Institute of Technology (KTH)

Institut de la Microelectronique, Electromagnetisme et Photonique - Laboratoire d'Hyperfrequences et de Caracterisation

E Sangiorgi

Institut de la Microelectronique, Electromagnetisme et Photonique - Laboratoire d'Hyperfrequences et de Caracterisation

G Ghibaudo

IMEP-FMNT

Institut de la Microelectronique, Electromagnetisme et Photonique - Laboratoire d'Hyperfrequences et de Caracterisation

D Flandre

Institut de la Microelectronique, Electromagnetisme et Photonique - Laboratoire d'Hyperfrequences et de Caracterisation

Universite catholique de Louvain

Materials Science in Semiconductor Processing

1369-8001 (ISSN)

Vol. 11 5 148-159

Subject Categories

Other Engineering and Technologies

DOI

10.1016/j.mssp.2008.09.017

More information

Latest update

4/6/2022 5