HIGH ROBUSTNESS GAN HEMT SUBJECT TO REVERSE BIAS STRESS
Paper in proceeding, 2010
Author
A. Stucco
A. Ronchi
A. Chini
Per-Åke Nilsson
Chalmers, Microtechnology and Nanoscience (MC2), Microwave Electronics
G. Meneghesso
E. Zanoni
Wocsdice 2010
Subject Categories
Other Electrical Engineering, Electronic Engineering, Information Engineering