TOF-SIMS analysis using C-60- effect of impact energy on yield and damage

John Fletcher; X. A. Conlan; E. A. Jones; G. Biddulph; N. P. Lockyer; J. C. Vickerman

doi:10.1021/ac051624w

TOF-SIMS analysis using C-60- effect of impact energy on yield and damage
Journal article, 2006

Author

John Fletcher

Other publications Research

X. A. Conlan

E. A. Jones

G. Biddulph

N. P. Lockyer

J. C. Vickerman

Analytical Chemistry

0003-2700 (ISSN) 1520-6882 (eISSN)

Vol. 78 6 1827-1831

Subject Categories

Analytical Chemistry

DOI

10.1021/ac051624w

Publication data connected to DOI

More information

Created

10/10/2017

If you have questions, need help, find a bug or just want to give us feedback you may use this form, or contact us per e-mail research.lib@chalmers.se.

Message

Your email address

Research.chalmers.se contains research information from Chalmers University of Technology, Sweden. It includes information on projects, publications, research funders and collaborations.

More about coverage period and what is publicly available

Privacy and cookies

Accessibility

Citation Style Language
citeproc-js (Frank Bennett)

Chalmers Library

Chalmers Research

Chalmers Student Theses

SE-412 96 GOTHENBURG, SWEDEN
PHONE: +46 (0)31-772 10 00
WWW.CHALMERS.SE