Effects of Cryogenic Sample Analysis on Molecular Depth Profiles with TOF-Secondary Ion Mass Spectrometry

Alan M. Piwowar; John Fletcher; Jeanette Kordys; Nicholas P. Lockyer; Nicholas Winograd; John C. Vickerman

doi:10.1021/ac101746h

Effects of Cryogenic Sample Analysis on Molecular Depth Profiles with TOF-Secondary Ion Mass Spectrometry
Journal article, 2010

Author

Alan M. Piwowar

John Fletcher

Other publications Research

Jeanette Kordys

Nicholas P. Lockyer

Nicholas Winograd

John C. Vickerman

Analytical Chemistry

Vol. 82 19 8291-8299

Subject Categories

Analytical Chemistry

DOI

10.1021/ac101746h

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Created

10/10/2017

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