Cluster and polyatomic primary ion beams
Book chapter, 2013

Author

John Fletcher

University of Gothenburg

Christopher Szakal

ToF-SIMS: Materials Analysis by Mass Spectrometry, 2nd Ed.

291-310

Subject Categories

Analytical Chemistry

Materials Chemistry

Condensed Matter Physics

ISBN

978-1-906715-17-5

More information

Created

10/10/2017