Veselago's lens consisting of left-handed materials with arbitrary index of refraction
Journal article, 2006

We study Veselago's lens with arbitrary index of refraction and characteristic impedance. Using a full wave optics calculation, we show that this lens can be considered as an imaging system and we derive the appropriate lens formula. The lens with arbitrary index and impedance retains some of the properties of the matched lens, such as the invariance of its optical axis, three-dimensional imaging and easy manufacturing, but it loses the property of sub-wavelength resolution. We also show that identical results can be obtained for the impedance matched lens in the framework of paraxial geometrical optics, from which it can be inferred that optical systems containing such a lens can be studied and designed using traditional ray-tracing tools.

perfect lens

imaging system

negative index of refraction

left-handed material

subwavelength resolution





Philippe Tassin

Chalmers, Applied Physics, Condensed Matter Theory

Irina Veretennicoff

Guy Van Der Sande

Optics Communications

0030-4018 (ISSN)

Vol. 264 1 130-134

Areas of Advance

Nanoscience and Nanotechnology (2010-2017)

Subject Categories

Atom and Molecular Physics and Optics

Other Electrical Engineering, Electronic Engineering, Information Engineering

Condensed Matter Physics



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