Effect of enhanced current crowding in a CPW with a thin ferroelectric film
Journal article, 1997

Enhanced current crowding is predicted at the edges of the conducting strips in thin ferroelectric film coplanar waveguides (CPWs). A minimum current crowding depth is expected, which depends on the CPW geometry and dielectric constant of the ferroelectric film. In practical CPW devices the enhanced current crowding can increase the conductor losses by up to four times. The current crowding depth may be smaller than the skin depth or London penetration depth (for high temperature superconducting CPW)

coplanar waveguides current distribution electric fields ferroelectric thin films losses microwave devices permittivity waveguide theory


Erik F. Carlsson

Department of Microwave Technology

Spartak Gevorgian

Department of Microelectronics and Nanoscience

Electronics Letters

0013-5194 (ISSN) 1350-911X (eISSN)

Vol. 33 2 145-146

Subject Categories

Electrical Engineering, Electronic Engineering, Information Engineering

Condensed Matter Physics



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