Effect of photon-assisted Andreev reflection in the accuracy of a SINIS turnstile
Journal article, 2015

We consider a hybrid single-electron transistor constituted by a gate-controlled normal-metal island (N) connected to two voltage-biased superconducting leads (S) by means of two tunnel junctions (SINIS), operated as a turnstile. We show that the exchange of photons between this system and the high-temperature electromagnetic environment where it is embedded enhances Andreev reflection, thereby limiting the single-electron tunneling accuracy.

Author

Angelo di Marco

Grenoble Alpes University

V. F. Maisi

Centre for Metrology and Accreditation Finland

Aalto University

F. W. J. Hekking

Grenoble Alpes University

J. Pekola

Aalto University

Physical Review B - Condensed Matter and Materials Physics

24699950 (ISSN) 24699969 (eISSN)

Vol. 92 9

Subject Categories

Nano Technology

DOI

10.1103/PhysRevB.92.094514

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Latest update

9/3/2019 1