Leakage current effects on C-V plots of high-k MOS capacitors
Paper in proceeding, 2008
Author
Y Lu
S. Hall
I. Z. Mitrovic
W.M. Davey
Bahman Raeissi
Chalmers, Microtechnology and Nanoscience (MC2)
Olof Engström
Chalmers, Applied Physics, Physical Electronics
K. Cherkaoui
S Monaghan
P.K. Hurley
H.D.B. Gottlob
M.C. Lemme
WODIM, Berlin, June 2008
Subject Categories
Other Engineering and Technologies
Other Engineering and Technologies not elsewhere specified