Electrical Characterization of Novel Insulators in Metal-Insulator-Semiconductor Structures
Doctoral thesis, 1997
silicon dioxide
MOS
Fowler-Nordheim injection
charge transport
MIS
wafer bonding
polycrystalline diamond
capacitance
Author
Anders Jauhiainen
Department of Solid State Electronics
Subject Categories
Physical Sciences
Electrical Engineering, Electronic Engineering, Information Engineering
ISBN
91-7197-575-6
Technical report - School of Electrical and Computer Engineering, Chalmers University of Technology, Göteborg, Sweden: 323
Doktorsavhandlingar vid Chalmers tekniska högskola. Ny serie: 1350