Classification of energy levels in quantum dot structures by means of depletion layer spectroscopy methods
Paper in proceeding, 2009
Author
M Kaniewska
Olof Engström
Chalmers, Applied Physics, Physical Electronics
M Kaczmarczyk
13th Internation Conference on Defects-Recognition, Imaging and Physics in Semiconductors, Wheeling, West Virginia, USA, September 13-17, 2009 (Invited)
Subject Categories
Other Engineering and Technologies
Other Engineering and Technologies not elsewhere specified