Ab initio structure modelling of complex thin-film oxides: thermodynamical stability of TiC/thin-film alumina
Journal article, 2010
Structure modeling
thin films
interfaces
DFT
oxides
Author
Jochen Rohrer
Chalmers, Applied Physics, Electronics Material and Systems
Carlo Ruberto
Chalmers, Applied Physics, Electronics Material and Systems
Chalmers, Applied Physics, Materials and Surface Theory
Per Hyldgaard
Chalmers, Applied Physics, Electronics Material and Systems
Journal of Physics Condensed Matter
0953-8984 (ISSN) 1361-648X (eISSN)
Vol. 22 1 015004- 015004Areas of Advance
Nanoscience and Nanotechnology
Materials Science
Subject Categories
Manufacturing, Surface and Joining Technology
Other Engineering and Technologies not elsewhere specified
Chemical Process Engineering
Other Physics Topics
Condensed Matter Physics
Driving Forces
Innovation and entrepreneurship
DOI
10.1088/0953-8984/22/1/015004