Improvement of chip design to reduce resonances in subgap regime of Josephson junctions
Paper in proceedings, 2009

Excess current peaks in the IV curves of SIS Josephson junctions have been observed by some groups [1–3]. These peaks have the shape of a resonance as a function of voltage. The resonances appear in the subgap regime of the junctions and the subgap current (leakage current) is concealed. The positions of the resonances do not change as a magnetic field is applied to the junctions, but their amplitude decreases when the supercurrent is suppressed. We have measured the subgap current of Al/AlOx/Al junctions and we show that these resonances are due to resonant modes in the chip design which are excited by the ac-Josephson effect. We present a chip design that decreases the amplitude of the resonances to a such degree that the subgap current is quantifiable.

superconductivity

Josephson junctions

onchip resonances

Author

Tine Greibe

Chalmers, Microtechnology and Nanoscience (MC2), Quantum Device Physics

Thilo Bauch

Chalmers, Microtechnology and Nanoscience (MC2), Quantum Device Physics

Christopher Wilson

Chalmers, Microtechnology and Nanoscience (MC2), Quantum Device Physics

Per Delsing

Chalmers, Microtechnology and Nanoscience (MC2), Quantum Device Physics

Journal of Physics: Conference Series

17426588 (ISSN) 17426596 (eISSN)

Vol. 150 052063-

Subject Categories

Condensed Matter Physics

DOI

10.1088/1742-6596/150/5/052063

More information

Created

10/7/2017