Improvement of chip design to reduce resonances in subgap regime of Josephson junctions
Paper i proceeding, 2009

Excess current peaks in the IV curves of SIS Josephson junctions have been observed by some groups [1–3]. These peaks have the shape of a resonance as a function of voltage. The resonances appear in the subgap regime of the junctions and the subgap current (leakage current) is concealed. The positions of the resonances do not change as a magnetic field is applied to the junctions, but their amplitude decreases when the supercurrent is suppressed. We have measured the subgap current of Al/AlOx/Al junctions and we show that these resonances are due to resonant modes in the chip design which are excited by the ac-Josephson effect. We present a chip design that decreases the amplitude of the resonances to a such degree that the subgap current is quantifiable.

superconductivity

Josephson junctions

onchip resonances

Författare

Tine Greibe

Chalmers, Mikroteknologi och nanovetenskap (MC2), Kvantkomponentfysik

Thilo Bauch

Chalmers, Mikroteknologi och nanovetenskap (MC2), Kvantkomponentfysik

Christopher Wilson

Chalmers, Mikroteknologi och nanovetenskap (MC2), Kvantkomponentfysik

Per Delsing

Chalmers, Mikroteknologi och nanovetenskap (MC2), Kvantkomponentfysik

Journal of Physics: Conference Series

1742-6588 (ISSN)

Vol. 150 052063-

Ämneskategorier

Den kondenserade materiens fysik

DOI

10.1088/1742-6596/150/5/052063

Mer information

Skapat

2017-10-07