Multi-line TRL calibration compared to a general de-embedding method
Paper in proceeding, 2009
Author
Mattias Ferndahl
Chalmers, Microtechnology and Nanoscience (MC2), Microwave Electronics
Kristoffer Andersson
Chalmers, Microtechnology and Nanoscience (MC2), Microwave Electronics
Christian Fager
Chalmers, Microtechnology and Nanoscience (MC2), Microwave Electronics
ARFTG 73rd Microwave Measurement Conference
Vol. 1
Subject Categories
Telecommunications
Control Engineering