A novel model for simulation of RF oscillator phase noise
Conference contribution, 2010

A novel model of the RF oscillator's phase noise process has been provided in this work, resulting in a more accurate model than the conventional Wiener process. The phase noise is considered as the integration of frequency noise which consists of white and flicker noise, whereas the Wiener process is the integration result of white noise only. Analytical expressions of the oscillator RMS jitter and the Single-Side Band (SSB) phase noise (L) are presented and compared to the simulation and measurement results for verification. The relationship between 1/f 3 -1/f 2 corner frequency in the PSD and the slope transition corner in RMS jitter plot is consistent with the analytical and measurement results. The simulation result shows that the PSD of the oscillator becomes Gaussian close to the carrier, followed by power-law regions, in consistense with the analytical expression. © 2010 IEEE.

Wiener process

RF oscillator

Jitter

Phase noise

Gaussian process

Author

Siamak Yousefi

Chalmers, Signals and Systems

Thomas Eriksson

Chalmers, Signals and Systems, Communication and Antenna Systems, Communication Systems

Dan Kuylenstierna

Chalmers, Microtechnology and Nanoscience (MC2), Microwave Electronics

2010 IEEE Radio and Wireless Symposium, RWW 2010 - Paper Digest

428-431

Subject Categories

Electrical Engineering, Electronic Engineering, Information Engineering

DOI

10.1109/RWS.2010.5434193

ISBN

978-142444726-8

More information

Latest update

7/22/2019