HIGH ROBUSTNESS GAN HEMT SUBJECT TO REVERSE BIAS STRESS
Paper in proceedings, 2010

Author

A. Stucco

A. Ronchi

A. Chini

Per-Åke Nilsson

Chalmers, Microtechnology and Nanoscience (MC2), Microwave Electronics

G. Meneghesso

E. Zanoni

Wocsdice 2010

Subject Categories

Other Electrical Engineering, Electronic Engineering, Information Engineering

More information

Created

10/6/2017