Capture cross sections for holes at LaLuO/Si interfaces
Paper in proceeding, 2010
Author
Olof Engström
Chalmers, Applied Physics, Physical Electronics
F Ducroquet
Bahman Raeissi
Chalmers, Microtechnology and Nanoscience (MC2)
J. Schubert
J.M.J Lopes
H. D. B. Gottlob
Published in
Proceedings of the 16th Workshop on Dielectrics in Microelectronics, p. 29, Bratislava, June 28 - 30 2010
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