Capture cross sections for holes at LaLuO/Si interfaces
Paper in proceeding, 2010

Author

Olof Engström

Chalmers, Applied Physics, Physical Electronics

F Ducroquet

Bahman Raeissi

Chalmers, Microtechnology and Nanoscience (MC2)

J. Schubert

J.M.J Lopes

H. D. B. Gottlob

Published in

Proceedings of the 16th Workshop on Dielectrics in Microelectronics, p. 29, Bratislava, June 28 - 30 2010

Categorizing

Subject Categories

Other Engineering and Technologies not elsewhere specified

More information

Created

10/6/2017