Capture cross sections for holes at LaLuO/Si interfaces
Paper in proceedings, 2010


Olof Engström

Chalmers, Applied Physics, Physical Electronics

F Ducroquet

Bahman Raeissi

Chalmers, Microtechnology and Nanoscience (MC2)

J. Schubert

J.M.J Lopes

H. D. B. Gottlob

Proceedings of the 16th Workshop on Dielectrics in Microelectronics, p. 29, Bratislava, June 28 - 30 2010

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