Capture cross sections for holes at LaLuO/Si interfaces
Paper in proceeding, 2010
Author
Olof Engström
Chalmers, Applied Physics, Physical Electronics
F Ducroquet
Bahman Raeissi
Chalmers, Microtechnology and Nanoscience (MC2)
J. Schubert
J.M.J Lopes
H. D. B. Gottlob
Proceedings of the 16th Workshop on Dielectrics in Microelectronics, p. 29, Bratislava, June 28 - 30 2010
Subject Categories
Other Engineering and Technologies not elsewhere specified