Electron backscattering diffraction and X-ray diffraction studies of interface relationships in Sr3Ru2O7/Sr2RuO4 eutectic crystals
Journal article, 2011
transport-properties
Eutectic structure
FEG-SEM
itinerant ferromagnet srruo3
growth
EBSD
X-ray diffraction
bulk
sr1-xcaxruo3
Author
Regina Ciancio
Chalmers, Applied Physics, Microscopy and Microanalysis
Henrik Pettersson
Chalmers, Applied Physics, Microscopy and Microanalysis
R. Fittipaldi
University of Salerno
Alexei Kalaboukhov
Chalmers, Microtechnology and Nanoscience (MC2), Quantum Device Physics
P. Orgiani
National Research Council of Italy (CNR)
A. Vecchione
University of Salerno
Y. Maeno
Kyoto University
S. Pace
University of Salerno
Eva Olsson
Chalmers, Applied Physics, Microscopy and Microanalysis
Micron
0968-4328 (ISSN)
Vol. 42 4 324-329Subject Categories (SSIF 2011)
Physical Sciences
DOI
10.1016/j.micron.2010.03.012