Electron backscattering diffraction and X-ray diffraction studies of interface relationships in Sr3Ru2O7/Sr2RuO4 eutectic crystals
Artikel i vetenskaplig tidskrift, 2011

Sr3Ru2O7/Sr2RuO4 eutectic system is investigated by electron backscattering diffraction (EBSD) and X-ray diffraction (XRD). The eutectic growth enables the solidification of the two phases in an ordered lamellar pattern extending along the growth direction, namely the b-axis direction. The eutectic material thus provides in the a-c plane two distinct interfaces having different microstructures with respect to the growth direction. Our analysis shows that, across the inplane c-axis direction (characterized by a poor lattice matching), the b-axis orientation is not constant at the individual interfaces, showing an orientation spread of about 5 degrees. However, across the in-plane a-axis direction (characterized by a good lattice matching), the b-axis orientation does not change within a few tenths of degree (about 0.25 degrees). Such information at nanoscale is also verified on a macroscopic level by standard XRD investigation.

itinerant ferromagnet srruo3

growth

transport-properties

FEG-SEM

X-ray diffraction

EBSD

Eutectic structure

sr1-xcaxruo3

bulk

Författare

Regina Ciancio

Chalmers, Teknisk fysik, Mikroskopi och mikroanalys

Henrik Pettersson

Chalmers, Teknisk fysik, Mikroskopi och mikroanalys

R. Fittipaldi

Universita degli Studi di Salerno

Alexei Kalaboukhov

Chalmers, Mikroteknologi och nanovetenskap (MC2), Kvantkomponentfysik

P. Orgiani

SPIN CNR Institute - Salerno

A. Vecchione

Universita degli Studi di Salerno

Y. Maeno

Kyoto University

S. Pace

Universita degli Studi di Salerno

Eva Olsson

Chalmers, Teknisk fysik, Mikroskopi och mikroanalys

Micron

0968-4328 (ISSN)

Vol. 42 324-329

Ämneskategorier

Fysik

DOI

10.1016/j.micron.2010.03.012