Method for measuring reflectance of semiconductor disk laser gain element under optical pump excitation
Conference poster, 2011
We present a new measurement method for measuring the spectral reflectance of a semiconductor disk laser gain element under optical pumping, providing valuable information on the spectral dependence of gain under close-to-normal operating conditions.
vertical-external-cavity surface-emitting laser
optically pumped semiconductor disk laser
Semiconductor laser
reflectance
Author
Carl Borgentun
Chalmers, Microtechnology and Nanoscience (MC2), Photonics
Jörgen Bengtsson
Chalmers, Microtechnology and Nanoscience (MC2), Photonics
Anders Larsson
Chalmers, Microtechnology and Nanoscience (MC2), Photonics
Conference on Lasers and Electro-Optics (CLEO), Baltimore, USA, 1-6/5 2011
Areas of Advance
Nanoscience and Nanotechnology (SO 2010-2017, EI 2018-)
Subject Categories
Telecommunications
Atom and Molecular Physics and Optics