Method for measuring reflectance of semiconductor disk laser gain element under optical pump excitation
Conference poster, 2011

We present a new measurement method for measuring the spectral reflectance of a semiconductor disk laser gain element under optical pumping, providing valuable information on the spectral dependence of gain under close-to-normal operating conditions.

vertical-external-cavity surface-emitting laser

optically pumped semiconductor disk laser

Semiconductor laser

reflectance

Author

Carl Borgentun

Chalmers, Microtechnology and Nanoscience (MC2), Photonics

Jörgen Bengtsson

Chalmers, Microtechnology and Nanoscience (MC2), Photonics

Anders Larsson

Chalmers, Microtechnology and Nanoscience (MC2), Photonics

Conference on Lasers and Electro-Optics (CLEO), Baltimore, USA, 1-6/5 2011

Areas of Advance

Nanoscience and Nanotechnology (2010-2017)

Subject Categories

Telecommunications

Atom and Molecular Physics and Optics

More information

Created

10/8/2017