Fabrication of corrugated probes for scanning near-field optical microscopy
Paper in proceeding, 2011
Corregated SNOM probes
Scanning near-field optical microscopy
SNOM probes
Etching
Turner method
Aperture metal-coated probes
Bragg grating
Author
P. Wróbel
University of Warsaw
T. Stefaniuk
University of Warsaw
Tomasz Antosiewicz
Chalmers, Applied Physics, Condensed Matter Theory
A. Libura
Polish Academy of Sciences
G. Nowak
Polish Academy of Sciences
T. Wejrzanowski
Warsaw University of Technology
R. Slesinski
Warsaw University of Technology
K. Jedrzejewski
Warsaw University of Technology
T. Szoplik
University of Warsaw
Proceedings of SPIE - The International Society for Optical Engineering
0277786X (ISSN) 1996756X (eISSN)
Vol. 8070 80700I978-081948660-8 (ISBN)
Subject Categories
Electrical Engineering, Electronic Engineering, Information Engineering
DOI
10.1117/12.886844
ISBN
978-081948660-8