Study into high temperature reliability of isotropic conductive adhesive
Paper in proceeding, 2011
Author
W. Du
Shanghai University
H. Cui
Shanghai University
S. Chen
Shanghai University
Z. Yuan
Shanghai University
L. Ye
SHT Smart High-Tech
Johan Liu
Chalmers, Applied Physics, Electronics Material and Systems
Proceedings - 12th International Conference on Electronic Packaging Technology and High Density Packaging, ICEPT-HDP 2011, Shanghai, 8-11 August 2011
1053-1055
978-145771768-0 (ISBN)
Subject Categories
Electrical Engineering, Electronic Engineering, Information Engineering
DOI
10.1109/ICEPT.2011.6067009
ISBN
978-145771768-0