Admittance spectroscopy of Si/LaLuO3 and Si/GdSiO MOS Structures (Invited)
Journal article, 2012

Author

F. Ducroquet

Olof Engström

Chalmers, Microtechnology and Nanoscience (MC2), Terahertz and Millimetre Wave Laboratory

H. D. B. Gottlob

J. M. J. Lopes

J. Schubert

ECS Transactions

1938-5862 (ISSN) 1938-6737 (eISSN)

Vol. 45 3 103 - 117

Subject Categories

Nano Technology

Other Electrical Engineering, Electronic Engineering, Information Engineering

More information

Created

10/8/2017