Admittance spectroscopy of Si/LaLuO3 and Si/GdSiO MOS Structures (Invited)
Paper in proceeding, 2012
Author
F. Ducroquet
CEA-Leti: Laboratoire d'électronique des technologies de l'information
Olof Engström
Chalmers, Microtechnology and Nanoscience (MC2), Terahertz and Millimetre Wave Laboratory
H. D. B. Gottlob
AMO
J. M. J. Lopes
Forschungszentrum Jülich
J. Schubert
Forschungszentrum Jülich
Published in
ECS Transactions
19385862 (ISSN) 19386737 (eISSN)
Vol. 45 Issue 3 p. 103 - 117978-156677955-5 (ISBN)
Conference
Seattle, WA, USA,
Categorizing
Subject Categories (SSIF 2011)
Nano Technology
Other Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
DOI
10.1149/1.3700877