Properties of C-84 and C24H12 molecular ion sources for routine TOF-SIMS analysis

Gregory X. Biddulph; Alan M. Piwowar; John Fletcher; Nicholas P. Lockyer; John C. Vickerman

doi:10.1021/ac071442x

Properties of C-84 and C24H12 molecular ion sources for routine TOF-SIMS analysis
Journal article, 2007

Author

Gregory X. Biddulph

Alan M. Piwowar

John Fletcher

Other publications Research

Nicholas P. Lockyer

John C. Vickerman

Analytical Chemistry

0003-2700 (ISSN) 1520-6882 (eISSN)

Vol. 79 19 7259-7266

Subject Categories

Analytical Chemistry

DOI

10.1021/ac071442x

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10/10/2017

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