Secondary Ion Mass Spectrometry: Characterizing Complex Samples in Two and Three Dimensions.
Review article, 2013

Author

John Fletcher

University of Gothenburg

Other publications Research

John C Vickerman

Analytical Chemistry

0003-2700 (ISSN) 1520-6882 (eISSN)

Vol. 85 2 610-639

Subject Categories

Analytical Chemistry

DOI

10.1021/ac303088m

Publication data connected to DOI

PubMed

23094968

More information

Created

10/10/2017

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