Secondary Ion Mass Spectrometry: Characterizing Complex Samples in Two and Three Dimensions.
Reviewartikel, 2013

Författare

John Fletcher

Göteborgs universitet

John C Vickerman

Analytical Chemistry

0003-2700 (ISSN) 1520-6882 (eISSN)

Vol. 85 2 610-639

Ämneskategorier

Analytisk kemi

DOI

10.1021/ac303088m

PubMed

23094968