Electrical and structural properties of ABO3/SrTiO3 interfaces
Paper in proceedings, 2012

Electrical transport and microstructure of interfaces between nm-thick films of various perovskite oxides grown by pulsed laser deposition (PLD) on TiO2 terminated SrTiO3 (STO) substrates are compared. LaAlO3/STO and KTaO3/STO interfaces become quasi-2DEG after a critical film thickness of 4 unit cell layers. The conductivity survives long anneals in oxygen atmosphere. LaMnO3/STO interfaces remain insulating for all film thicknesses and NdGaO3/STO interfaces are conducting but the conductivity is eliminated after oxygen annealing. Medium-energy ion spectroscopy and scanning transmission electron microscopy detect cationic intermixing within several atomic layers from the interface in all studied interfaces. Our results indicate that the electrical reconstruction in the polar oxide interfaces is a complex combination of different mechanisms, and oxygen vacancies play an important role.

Author

Alexei Kalaboukhov

Chalmers, Microtechnology and Nanoscience (MC2), Quantum Device Physics

Other publications Research

Tord Claeson

Chalmers, Microtechnology and Nanoscience (MC2), Quantum Device Physics

Other publications Research

Pier Paolo Aurino

Chalmers, Microtechnology and Nanoscience (MC2), Quantum Device Physics

Other publications Research

Robert Gunnarsson

Chalmers, Microtechnology and Nanoscience (MC2), Quantum Device Physics

Other publications Research

Dag Winkler

Chalmers, Microtechnology and Nanoscience (MC2), Quantum Device Physics

Other publications Research

Eva Olsson

Chalmers, Applied Physics, Microscopy and Microanalysis

Chalmers, Applied Physics, Eva Olsson Group

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Nikolina Tuzla

Chalmers, Applied Physics, Eva Olsson Group

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Johan Börjesson

Chalmers, Applied Physics, Microscopy and Microanalysis

Chalmers, Applied Physics, Eva Olsson Group

Other publications Research

Yu A. Boikov

Russian Academy of Sciences

I.T. Serenkov

Russian Academy of Sciences

V.I. Sakharov

Russian Academy of Sciences

M. P. Volkov

Russian Academy of Sciences

Materials Research Society Symposium Proceedings

0272-9172 (ISSN)

Vol. 1454 167-172

Subject Categories

Physical Sciences

DOI

10.1557/opl.2012.925

Publication data connected to DOI

ISBN

978-160511431-6

More information

Latest update

7/4/2018 1

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