RF characterization of cold-electron bolometer integrated with a unilateral finline
Paper in proceeding, 2012
RF testing
Millimeter-wave detectors
Nanodevices
e-beam lithography
Nanotechnology
Author
Ernst Otto
Chalmers, Microtechnology and Nanoscience (MC2), Quantum Device Physics
P. K. Grimes
University of Oxford
Smithsonian Astrophysical Observatory
G. Yassin
University of Oxford
Mikhail Tarasov
Chalmers, Microtechnology and Nanoscience (MC2), Quantum Device Physics
Leonid Kuzmin
Chalmers, Microtechnology and Nanoscience (MC2), Quantum Device Physics
S. Withington
University of Cambridge
Proceedings of SPIE - The International Society for Optical Engineering
0277786X (ISSN) 1996756X (eISSN)
Vol. 8452 Art. no. 84521X- 84521X978-081949153-4 (ISBN)
Subject Categories
Electrical Engineering, Electronic Engineering, Information Engineering
ISBN
978-081949153-4