MOSFET degradation and hot electron modeling
Doctoral thesis, 1991
hot-electron degradation effects
Coulumb scattering
spatially dependent direct integration
direct integration method
Author
Anders T. Dejenfelt
Department of Solid State Electronics
Subject Categories (SSIF 2011)
Computer and Information Science
ISBN
91-7032-558-8
Technical report - School of Electrical and Computer Engineering, Chalmers University of Technology, Göteborg, Sweden: 208
Doktorsavhandlingar vid Chalmers tekniska högskola. Ny serie: 789