MOSFET degradation and hot electron modeling
Doctoral thesis, 1991
hot-electron degradation effects
Coulumb scattering
spatially dependent direct integration
direct integration method
Author
Anders T. Dejenfelt
Department of Solid State Electronics
Subject Categories
Computer and Information Science
ISBN
91-7032-558-8
Technical report - School of Electrical and Computer Engineering, Chalmers University of Technology, Göteborg, Sweden: 208
Doktorsavhandlingar vid Chalmers tekniska högskola. Ny serie: 789