MOSFET degradation and hot electron modeling
Doctoral thesis, 1991

hot-electron degradation effects

Coulumb scattering

spatially dependent direct integration

direct integration method

Author

Anders T. Dejenfelt

Department of Solid State Electronics

Subject Categories (SSIF 2011)

Computer and Information Science

ISBN

91-7032-558-8

Technical report - School of Electrical and Computer Engineering, Chalmers University of Technology, Göteborg, Sweden: 208

Doktorsavhandlingar vid Chalmers tekniska högskola. Ny serie: 789

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Created

10/6/2017